Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits

Bernd Deutschmann, H. Pitsch, G. Langer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages27-32
Publication statusPublished - 2005

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., Pitsch, H., & Langer, G. (2005). Near Field Measurements to Predict the Electromagnetic Emission of Integrated Circuits. In International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 27-32). ..