Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy

Stefanie Fladischer, Alfred Neuhold, Stefan Mitsche, Nadezda Matsko, E. Kraker, A. Haase, B. Lamprecht, Roland Resel, Werner Grogger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Conference on Organic Electronics
Publisher.
Pages235-236
Publication statusPublished - 2010
EventInternational Conference of Organic Electronics 2010 - Paris, Frankreich
Duration: 22 Jun 201025 Jun 2010

Conference

ConferenceInternational Conference of Organic Electronics 2010
CityParis, Frankreich
Period22/06/1025/06/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Fladischer, S., Neuhold, A., Mitsche, S., Matsko, N., Kraker, E., Haase, A., ... Grogger, W. (2010). Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy. In International Conference on Organic Electronics (pp. 235-236). ..

Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy. / Fladischer, Stefanie; Neuhold, Alfred; Mitsche, Stefan; Matsko, Nadezda; Kraker, E.; Haase, A.; Lamprecht, B.; Resel, Roland; Grogger, Werner.

International Conference on Organic Electronics. ., 2010. p. 235-236.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fladischer, S, Neuhold, A, Mitsche, S, Matsko, N, Kraker, E, Haase, A, Lamprecht, B, Resel, R & Grogger, W 2010, Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy. in International Conference on Organic Electronics. ., pp. 235-236, International Conference of Organic Electronics 2010, Paris, Frankreich, 22/06/10.
Fladischer S, Neuhold A, Mitsche S, Matsko N, Kraker E, Haase A et al. Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy. In International Conference on Organic Electronics. . 2010. p. 235-236
Fladischer, Stefanie ; Neuhold, Alfred ; Mitsche, Stefan ; Matsko, Nadezda ; Kraker, E. ; Haase, A. ; Lamprecht, B. ; Resel, Roland ; Grogger, Werner. / Nanoanalytical characterization of organic photodiode by electron microscopy and atomic force microscopy. International Conference on Organic Electronics. ., 2010. pp. 235-236
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AU - Kraker, E.

AU - Haase, A.

AU - Lamprecht, B.

AU - Resel, Roland

AU - Grogger, Werner

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