Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

Stefanie Fladischer, A.G. Neuhold, Stefan Mitsche, E. Kraker, A. Haase, B. Lamprecht, R. Resel, Werner Grogger

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2010
EventInternational Conference of Organic Electronics 2010 - Paris, Frankreich
Duration: 22 Jun 201025 Jun 2010

Conference

ConferenceInternational Conference of Organic Electronics 2010
CityParis, Frankreich
Period22/06/1025/06/10

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Fladischer, S., Neuhold, A. G., Mitsche, S., Kraker, E., Haase, A., Lamprecht, B., ... Grogger, W. (2010). Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy. Poster session presented at International Conference of Organic Electronics 2010, Paris, Frankreich, .

Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy. / Fladischer, Stefanie; Neuhold, A.G.; Mitsche, Stefan; Kraker, E.; Haase, A.; Lamprecht, B.; Resel, R.; Grogger, Werner.

2010. Poster session presented at International Conference of Organic Electronics 2010, Paris, Frankreich, .

Research output: Contribution to conferencePosterResearch

Fladischer, S, Neuhold, AG, Mitsche, S, Kraker, E, Haase, A, Lamprecht, B, Resel, R & Grogger, W 2010, 'Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy' International Conference of Organic Electronics 2010, Paris, Frankreich, 22/06/10 - 25/06/10, .
Fladischer S, Neuhold AG, Mitsche S, Kraker E, Haase A, Lamprecht B et al. Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy. 2010. Poster session presented at International Conference of Organic Electronics 2010, Paris, Frankreich, .
Fladischer, Stefanie ; Neuhold, A.G. ; Mitsche, Stefan ; Kraker, E. ; Haase, A. ; Lamprecht, B. ; Resel, R. ; Grogger, Werner. / Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy. Poster session presented at International Conference of Organic Electronics 2010, Paris, Frankreich, .
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title = "Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy",
author = "Stefanie Fladischer and A.G. Neuhold and Stefan Mitsche and E. Kraker and A. Haase and B. Lamprecht and R. Resel and Werner Grogger",
year = "2010",
language = "English",
note = "International Conference of Organic Electronics 2010 ; Conference date: 22-06-2010 Through 25-06-2010",

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TY - CONF

T1 - Nanoanalytical characterization of an organic photodiode by electron microscopy and atomic force microscopy

AU - Fladischer, Stefanie

AU - Neuhold, A.G.

AU - Mitsche, Stefan

AU - Kraker, E.

AU - Haase, A.

AU - Lamprecht, B.

AU - Resel, R.

AU - Grogger, Werner

PY - 2010

Y1 - 2010

M3 - Poster

ER -