Multi-Correlated Double Sampling vs. analog shaper: Low power ASIC for pixelated CdTe

A. Michalowska; O. Gevin; O. Limousin; C. S. Tindall

doi:10.1109/NSSMIC.2012.6551221

Multi-Correlated Double Sampling vs. analog shaper: Low power ASIC for pixelated CdTe

A. Michalowska^*, O. Gevin, O. Limousin, C. S. Tindall

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Abstract

Comparison of continuous time and discrete time noise filtering is presented. Two sets of measurements have been performed: one with the classical analog semi-Gaussian shaper (CR-RC²), the other with M-CDS (Multi-Correlated Double Sampling). The Charge Sensitive Amplifier used in the measurements is optimized for input capacitance of 1 pF and detector dark current below 5 pA. With the analog shaper the Equivalent Noise Charge is characterized as a function of peaking time. ENC in the M-CDS method is characterized against the sampling frequency and the number of samples. The two methods have been compared. They show very similar noise performances: in each case the ENC as low as 30 electrons rms was achieved with the input capacitance of 0.3 pF and CSA power consumption of 14 μW. Spectroscopy measurements with the CSA connected to Si diode were performed using the ⁵⁷Co source. The achieved FWHM resolutions were 390 eV at 14 keV with the analog shaper and 440 eV at 14 keV with the M-CDS method.

Original language	English
Title of host publication	2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2012
Pages	834-838
Number of pages	5
DOIs	https://doi.org/10.1109/NSSMIC.2012.6551221
Publication status	Published - 2012
Externally published	Yes
Event	2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2012 - Anaheim, CA, United States Duration: 29 Oct 2012 → 3 Nov 2012

Conference

Conference	2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2012
Country/Territory	United States
City	Anaheim, CA
Period	29/10/12 → 3/11/12

Keywords

Integrated circuits
X-ray
detection
Front-end

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

Access to Document

10.1109/NSSMIC.2012.6551221

Cite this

Michalowska, A, Gevin, O, Limousin, O & Tindall, CS 2012, Multi-Correlated Double Sampling vs. analog shaper: Low power ASIC for pixelated CdTe. in 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2012., 6551221, pp. 834-838, 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, NSS/MIC 2012, Anaheim, CA, United States, 29/10/12. https://doi.org/10.1109/NSSMIC.2012.6551221

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abstract = "Comparison of continuous time and discrete time noise filtering is presented. Two sets of measurements have been performed: one with the classical analog semi-Gaussian shaper (CR-RC2), the other with M-CDS (Multi-Correlated Double Sampling). The Charge Sensitive Amplifier used in the measurements is optimized for input capacitance of 1 pF and detector dark current below 5 pA. With the analog shaper the Equivalent Noise Charge is characterized as a function of peaking time. ENC in the M-CDS method is characterized against the sampling frequency and the number of samples. The two methods have been compared. They show very similar noise performances: in each case the ENC as low as 30 electrons rms was achieved with the input capacitance of 0.3 pF and CSA power consumption of 14 μW. Spectroscopy measurements with the CSA connected to Si diode were performed using the 57Co source. The achieved FWHM resolutions were 390 eV at 14 keV with the analog shaper and 440 eV at 14 keV with the M-CDS method.",

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AU - Limousin, O.

AU - Tindall, C. S.

PY - 2012

Y1 - 2012

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AB - Comparison of continuous time and discrete time noise filtering is presented. Two sets of measurements have been performed: one with the classical analog semi-Gaussian shaper (CR-RC2), the other with M-CDS (Multi-Correlated Double Sampling). The Charge Sensitive Amplifier used in the measurements is optimized for input capacitance of 1 pF and detector dark current below 5 pA. With the analog shaper the Equivalent Noise Charge is characterized as a function of peaking time. ENC in the M-CDS method is characterized against the sampling frequency and the number of samples. The two methods have been compared. They show very similar noise performances: in each case the ENC as low as 30 electrons rms was achieved with the input capacitance of 0.3 pF and CSA power consumption of 14 μW. Spectroscopy measurements with the CSA connected to Si diode were performed using the 57Co source. The achieved FWHM resolutions were 390 eV at 14 keV with the analog shaper and 440 eV at 14 keV with the M-CDS method.

KW - Integrated circuits

KW - X-ray

KW - detection

KW - Front-end

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ER -

Multi-Correlated Double Sampling vs. analog shaper: Low power ASIC for pixelated CdTe

Abstract

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Keywords

ASJC Scopus subject areas

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