MOSFET Aging Measurements and Hot-Electron Degradation Models

Research output: ThesisDiploma ThesisResearch

Original languageEnglish
Awarding Institution
  • Graz University of Technology (90000)
Supervisors/Advisors
  • Hadley, Peter, Supervisor
Thesis sponsors
Publication statusUnpublished - Oct 2016

Cite this

MOSFET Aging Measurements and Hot-Electron Degradation Models. / Schiffmann, Alexander.

2016. 149 p.

Research output: ThesisDiploma ThesisResearch

@phdthesis{7d2f1079e5c543fdaad44f3407a07d31,
title = "MOSFET Aging Measurements and Hot-Electron Degradation Models",
author = "Alexander Schiffmann",
year = "2016",
month = "10",
language = "English",
school = "Graz University of Technology (90000)",

}

TY - THES

T1 - MOSFET Aging Measurements and Hot-Electron Degradation Models

AU - Schiffmann, Alexander

PY - 2016/10

Y1 - 2016/10

M3 - Diploma Thesis

ER -