Modular Test System Architecture for Device, Circuit and System Level Reliability Testing

Roland Sleik, Michael Glavanovics, Sascha Einspieler, Annette Mütze, Klaus Krischan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIEEE Applied Power Electronics Conference and Exposition
Publisher.
Pages1-7
Publication statusPublished - 2016
EventIEEE Applied Power Electronics Conference and Exposition - Long Beach, CA, United States
Duration: 20 Mar 201624 Mar 2016

Conference

ConferenceIEEE Applied Power Electronics Conference and Exposition
CountryUnited States
CityLong Beach, CA
Period20/03/1624/03/16

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Application

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