@inproceedings{7450660e74fa4be09f7e42855c10c0f5,
title = "Modular Test System Architecture for Device, Circuit and System Level Reliability Testing",
author = "Roland Sleik and Michael Glavanovics and Sascha Einspieler and Annette M{\"u}tze and Klaus Krischan",
year = "2016",
language = "English",
pages = "1--7",
booktitle = "IEEE Applied Power Electronics Conference and Exposition",
publisher = ".",
note = "31st Annual IEEE Applied Power Electronics Conference and Exposition : APEC 2016 ; Conference date: 20-03-2016 Through 24-03-2016",
}