Modular Test System Architecture for Device, Circuit and System Level Reliability Testing

Roland Sleik, Michael Glavanovics, Sascha Einspieler, Annette Mütze, Klaus Krischan

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationIEEE Applied Power Electronics Conference and Exposition
Publisher.
Pages1-7
Publication statusPublished - 2016
Event31st Annual IEEE Applied Power Electronics Conference and Exposition: APEC 2016 - Long Beach, United States
Duration: 20 Mar 201624 Mar 2016

Conference

Conference31st Annual IEEE Applied Power Electronics Conference and Exposition
Country/TerritoryUnited States
CityLong Beach
Period20/03/1624/03/16

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Application

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