Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Research output: Contribution to conferencePosterResearch

Abstract



Workshop

WorkshopThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Abbreviated titleSERESSA 2017
CountryGermany
CityGarching
Period23/10/1726/10/17
Internet address

Fingerprint

Transistors

Keywords

  • Total Ionizing Dose
  • MOS
  • X-ray
  • Integrated circuits

Fields of Expertise

  • Information, Communication & Computing

Cite this

Bezhenova, V., & Michalowska-Forsyth, A. M. (2017). Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.

2017. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.

Research output: Contribution to conferencePosterResearch

Bezhenova, V & Michalowska-Forsyth, AM 2017, 'Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip' The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany, 23/10/17 - 26/10/17, .
Bezhenova V, Michalowska-Forsyth AM. Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. 2017. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.
Bezhenova, Varvara ; Michalowska-Forsyth, Alicja Malgorzata. / Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.
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title = "Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip",
keywords = "Total Ionizing Dose, MOS, X-ray, Integrated circuits",
author = "Varvara Bezhenova and Michalowska-Forsyth, {Alicja Malgorzata}",
year = "2017",
language = "English",
note = "The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, SERESSA 2017 ; Conference date: 23-10-2017 Through 26-10-2017",
url = "https://seressa.in.tum.de/",

}

TY - CONF

T1 - Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

AU - Bezhenova,Varvara

AU - Michalowska-Forsyth,Alicja Malgorzata

PY - 2017

Y1 - 2017

KW - Total Ionizing Dose

KW - MOS

KW - X-ray

KW - Integrated circuits

M3 - Poster

ER -