Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Research output: Contribution to conferencePoster

Abstract



Original languageEnglish
Publication statusPublished - 2017
EventThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications - Leibniz Rechenzentrum, Garching, Germany
Duration: 23 Oct 201726 Oct 2017
Conference number: 13
https://seressa.in.tum.de/

Workshop

WorkshopThe 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Abbreviated titleSERESSA 2017
CountryGermany
CityGarching
Period23/10/1726/10/17
Internet address

Keywords

  • Total Ionizing Dose
  • MOS
  • X-ray
  • Integrated circuits

Fields of Expertise

  • Information, Communication & Computing

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