Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images

Kelly Leonhardt, Guy Denuault, Bernhard Gollas

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2010
Event61st Meeting of the International Society for Electrochemistry - Nizza
Duration: 26 Sep 20101 Oct 2010

Conference

Conference61st Meeting of the International Society for Electrochemistry
CityNizza
Period26/09/101/10/10

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical

Cite this

Leonhardt, K., Denuault, G., & Gollas, B. (2010). Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images. Poster session presented at 61st Meeting of the International Society for Electrochemistry, Nizza, .

Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images. / Leonhardt, Kelly; Denuault, Guy; Gollas, Bernhard.

2010. Poster session presented at 61st Meeting of the International Society for Electrochemistry, Nizza, .

Research output: Contribution to conferencePosterResearch

Leonhardt, K, Denuault, G & Gollas, B 2010, 'Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images' 61st Meeting of the International Society for Electrochemistry, Nizza, 26/09/10 - 1/10/10, .
Leonhardt K, Denuault G, Gollas B. Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images. 2010. Poster session presented at 61st Meeting of the International Society for Electrochemistry, Nizza, .
Leonhardt, Kelly ; Denuault, Guy ; Gollas, Bernhard. / Modelling of AFM-SECM systems: influence of tip geometry and insulation defects on limiting current for approach curves and images. Poster session presented at 61st Meeting of the International Society for Electrochemistry, Nizza, .
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