Activities per year
Abstract
Enclosed layout is an effective way to mitigate radiation induced leakage current in NMOS transistors. The unconventional shape of such device makes modeling a challenging task. Evaluation of equivalent aspect ratio estimation is complicated by additional stress effects, such as STI stress. We incorporate the STI stress effect into simulation for enclosed layout transistor in order to evaluate accuracy of two equivalent aspect ratio evaluation models: the well-known mid-line approximation and the recently introduced isosceles trapezoid approximation
Original language | English |
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Title of host publication | 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
Place of Publication | Gothenburg |
Number of pages | 4 |
DOIs | |
Publication status | Published - 2021 |
Event | 18th Conference on Radiation Effects on Components and Systems : RADECS 2018 - Gothenburg, Sweden Duration: 16 Sept 2018 → 21 Sept 2018 http://www.radecs2018.org/ |
Conference
Conference | 18th Conference on Radiation Effects on Components and Systems |
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Abbreviated title | RADECS 2018 |
Country/Territory | Sweden |
City | Gothenburg |
Period | 16/09/18 → 21/09/18 |
Internet address |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Radiation
- Modelling and Simulation
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18th Conference on Radiation Effects on Components and Systems
Varvara Bezhenova (Participant) & Alicja Malgorzata Michalowska-Forsyth (Participant)
16 Sept 2018 → 21 Sept 2018Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)
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Modeling of annular gate MOS transistors
Varvara Bezhenova (Speaker) & Alicja Malgorzata Michalowska-Forsyth (Contributor)
19 Sept 2018Activity: Talk or presentation › Poster presentation › Science to science