Modeling of AFM-SECM tips: influence of defects, approach curves and imaging of surfaces

Kelly Leonhardt, Guy Denuault, Amra Avdic, Alois Lugstein, Emmerich Bertagnolli, Ilya Pobelov, Thomas Wandlowski, Ming Wu, Bernhard Gollas

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2010
EventCUSO - Summer School: Nanoelectrochemistry - Villars/Schweiz
Duration: 5 Sep 20109 Sep 2010

Conference

ConferenceCUSO - Summer School: Nanoelectrochemistry
CityVillars/Schweiz
Period5/09/109/09/10

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Theoretical
  • Basic - Fundamental (Grundlagenforschung)

Cite this

Leonhardt, K., Denuault, G., Avdic, A., Lugstein, A., Bertagnolli, E., Pobelov, I., ... Gollas, B. (2010). Modeling of AFM-SECM tips: influence of defects, approach curves and imaging of surfaces. Poster session presented at CUSO - Summer School: Nanoelectrochemistry, Villars/Schweiz, .