Model transformation and synchronization process patterns

Georg Macher, Christian Kreiner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

Embedded systems are already integrated into our everyday life and play a central role in all domains including automotive, aerospace, healthcare or industry. The complexity of embedded systems and software has grown significantly in recent years. Software's impact on embedded system's functionality, has led to an enormous increase of SW complexity, while reduction of innovation cycles and growing demand for extra-functional requirements. Supporting cooperation between the involved domain and SW development experts to combine their expertise is a core challenge in embedded software development. Nevertheless, today, a lack of tool support and integration makes it impossible to cover the complete development life cycle using model-driven development (MDD) paradigms. This paper identifies patterns of concurrent workflows in embedded system development which can be used to identify dependencies and consequences of concurrency of workflows and thus, highlight the basic problem and provide know-how how to overcome these issues and foster MDD along the development life cycle.

Original languageEnglish
Title of host publicationProceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015
PublisherAssociation of Computing Machinery
ISBN (Electronic)9781450338479
DOIs
Publication statusPublished - 8 Jul 2015
Event20th European Conference on Pattern Languages of Programs, EuroPLoP 2015 - Irsee, Germany
Duration: 8 Jul 201512 Jul 2015

Publication series

NameACM International Conference Proceeding Series
Volume08-12-July-2015

Conference

Conference20th European Conference on Pattern Languages of Programs, EuroPLoP 2015
CountryGermany
CityIrsee
Period8/07/1512/07/15

Fingerprint

Embedded systems
Synchronization
Embedded software
Life cycle
Software engineering
Innovation
Industry

Keywords

  • Concurrent workflow pattern
  • Embedded systems
  • Model-driven development

ASJC Scopus subject areas

  • Software
  • Human-Computer Interaction
  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications

Cite this

Macher, G., & Kreiner, C. (2015). Model transformation and synchronization process patterns. In Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015 [a25] (ACM International Conference Proceeding Series; Vol. 08-12-July-2015). Association of Computing Machinery. https://doi.org/10.1145/2855321.2855347

Model transformation and synchronization process patterns. / Macher, Georg; Kreiner, Christian.

Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015. Association of Computing Machinery, 2015. a25 (ACM International Conference Proceeding Series; Vol. 08-12-July-2015).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Macher, G & Kreiner, C 2015, Model transformation and synchronization process patterns. in Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015., a25, ACM International Conference Proceeding Series, vol. 08-12-July-2015, Association of Computing Machinery, 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015, Irsee, Germany, 8/07/15. https://doi.org/10.1145/2855321.2855347
Macher G, Kreiner C. Model transformation and synchronization process patterns. In Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015. Association of Computing Machinery. 2015. a25. (ACM International Conference Proceeding Series). https://doi.org/10.1145/2855321.2855347
Macher, Georg ; Kreiner, Christian. / Model transformation and synchronization process patterns. Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015. Association of Computing Machinery, 2015. (ACM International Conference Proceeding Series).
@inproceedings{f8b885c50fd64ba5a21677e207addc02,
title = "Model transformation and synchronization process patterns",
abstract = "Embedded systems are already integrated into our everyday life and play a central role in all domains including automotive, aerospace, healthcare or industry. The complexity of embedded systems and software has grown significantly in recent years. Software's impact on embedded system's functionality, has led to an enormous increase of SW complexity, while reduction of innovation cycles and growing demand for extra-functional requirements. Supporting cooperation between the involved domain and SW development experts to combine their expertise is a core challenge in embedded software development. Nevertheless, today, a lack of tool support and integration makes it impossible to cover the complete development life cycle using model-driven development (MDD) paradigms. This paper identifies patterns of concurrent workflows in embedded system development which can be used to identify dependencies and consequences of concurrency of workflows and thus, highlight the basic problem and provide know-how how to overcome these issues and foster MDD along the development life cycle.",
keywords = "Concurrent workflow pattern, Embedded systems, Model-driven development",
author = "Georg Macher and Christian Kreiner",
year = "2015",
month = "7",
day = "8",
doi = "10.1145/2855321.2855347",
language = "English",
series = "ACM International Conference Proceeding Series",
publisher = "Association of Computing Machinery",
booktitle = "Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015",
address = "United States",

}

TY - GEN

T1 - Model transformation and synchronization process patterns

AU - Macher, Georg

AU - Kreiner, Christian

PY - 2015/7/8

Y1 - 2015/7/8

N2 - Embedded systems are already integrated into our everyday life and play a central role in all domains including automotive, aerospace, healthcare or industry. The complexity of embedded systems and software has grown significantly in recent years. Software's impact on embedded system's functionality, has led to an enormous increase of SW complexity, while reduction of innovation cycles and growing demand for extra-functional requirements. Supporting cooperation between the involved domain and SW development experts to combine their expertise is a core challenge in embedded software development. Nevertheless, today, a lack of tool support and integration makes it impossible to cover the complete development life cycle using model-driven development (MDD) paradigms. This paper identifies patterns of concurrent workflows in embedded system development which can be used to identify dependencies and consequences of concurrency of workflows and thus, highlight the basic problem and provide know-how how to overcome these issues and foster MDD along the development life cycle.

AB - Embedded systems are already integrated into our everyday life and play a central role in all domains including automotive, aerospace, healthcare or industry. The complexity of embedded systems and software has grown significantly in recent years. Software's impact on embedded system's functionality, has led to an enormous increase of SW complexity, while reduction of innovation cycles and growing demand for extra-functional requirements. Supporting cooperation between the involved domain and SW development experts to combine their expertise is a core challenge in embedded software development. Nevertheless, today, a lack of tool support and integration makes it impossible to cover the complete development life cycle using model-driven development (MDD) paradigms. This paper identifies patterns of concurrent workflows in embedded system development which can be used to identify dependencies and consequences of concurrency of workflows and thus, highlight the basic problem and provide know-how how to overcome these issues and foster MDD along the development life cycle.

KW - Concurrent workflow pattern

KW - Embedded systems

KW - Model-driven development

UR - http://www.scopus.com/inward/record.url?scp=84982840768&partnerID=8YFLogxK

U2 - 10.1145/2855321.2855347

DO - 10.1145/2855321.2855347

M3 - Conference contribution

T3 - ACM International Conference Proceeding Series

BT - Proceedings of the 20th European Conference on Pattern Languages of Programs, EuroPLoP 2015

PB - Association of Computing Machinery

ER -