Model-Independent X‑ray Reflectivity Fitting for Structure Analysis of Poly(3-hexylthiophene) Films

Oliver Werzer, Roland Resel

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)3529-3533
JournalMacromolecules
Volume46
Issue number9
DOIs
Publication statusPublished - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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