Model for ESD LCD upset of a portable product

Jiang Xiao; David Pommerenke; Fan Zhou; James L. Drewniak; Hideki Shumiya; Takashi Yamada; Kenji Araki

doi:10.1109/ISEMC.2010.5711300

Model for ESD LCD upset of a portable product

Jiang Xiao^*, David Pommerenke, Fan Zhou, James L. Drewniak, Hideki Shumiya, Takashi Yamada, Kenji Araki

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

A hybrid method is developed to model Electro-Static Discharge (ESD) LCD (Liquid Crystal Display) upset in a portable product. It combines ESD scanning, full-wave simulation and circuit simulation. This methodology is applied in the investigation of system-level ESD problem of the LCD of the portable product by the following steps. First, the sensitive area of the portable product causing the failure is located by ESD scanning. Using the local injection measurement currents, a behavioural SPICE model is then developed to simulate the ESD failure. Third, a full wave block-level model is used to extract the current densities at the sensitive regions; those current densities are imported into the SPICE model to predict ESD upset levels. The combined model is verified by testing its ability to simulate the upset level of four system level ESD test conditions, leading to satisfactory results.

Original language	English
Title of host publication	IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages	354-358
Number of pages	5
DOIs	https://doi.org/10.1109/ISEMC.2010.5711300
Publication status	Published - 1 Dec 2010
Externally published	Yes
Event	2010 IEEE International Symposium on Electromagnetic Compatibility: EMC 2010 - Fort Lauderdale, United States Duration: 25 Jul 2010 → 30 Jul 2010

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2010 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Fort Lauderdale
Period	25/07/10 → 30/07/10

Keywords

ESD
Hybrid method
LCD
Soft-error

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2010.5711300

Cite this

Xiao, J., Pommerenke, D., Zhou, F., Drewniak, J. L., Shumiya, H., Yamada, T., & Araki, K. (2010). Model for ESD LCD upset of a portable product. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (pp. 354-358). Article 5711300 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711300

Model for ESD LCD upset of a portable product. / Xiao, Jiang; Pommerenke, David; Zhou, Fan et al.
IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program. 2010. p. 354-358 5711300 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Xiao, J, Pommerenke, D, Zhou, F, Drewniak, JL, Shumiya, H, Yamada, T & Araki, K 2010, Model for ESD LCD upset of a portable product. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program., 5711300, IEEE International Symposium on Electromagnetic Compatibility, pp. 354-358, 2010 IEEE International Symposium on Electromagnetic Compatibility, Fort Lauderdale, Florida, United States, 25/07/10. https://doi.org/10.1109/ISEMC.2010.5711300

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AU - Araki, Kenji

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Model for ESD LCD upset of a portable product

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Keywords

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