Model Based Test Case Generation for Distributed Embedded Systems

Valentin Constantin Chimisliu, Franz Wotawa

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Conference on Industrial Technology
Publisher.
Pagesp-p
Publication statusPublished - 2012
EventInternational Conference on Industrial Technology - Athens, Greece
Duration: 19 Mar 201222 Mar 2012

Conference

ConferenceInternational Conference on Industrial Technology
CountryGreece
CityAthens
Period19/03/1222/03/12

Fields of Expertise

  • Information, Communication & Computing

Cite this

Chimisliu, V. C., & Wotawa, F. (2012). Model Based Test Case Generation for Distributed Embedded Systems. In International Conference on Industrial Technology (pp. p-p). ..

Model Based Test Case Generation for Distributed Embedded Systems. / Chimisliu, Valentin Constantin; Wotawa, Franz.

International Conference on Industrial Technology. ., 2012. p. p-p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Chimisliu, VC & Wotawa, F 2012, Model Based Test Case Generation for Distributed Embedded Systems. in International Conference on Industrial Technology. ., pp. p-p, International Conference on Industrial Technology, Athens, Greece, 19/03/12.
Chimisliu VC, Wotawa F. Model Based Test Case Generation for Distributed Embedded Systems. In International Conference on Industrial Technology. . 2012. p. p-p
Chimisliu, Valentin Constantin ; Wotawa, Franz. / Model Based Test Case Generation for Distributed Embedded Systems. International Conference on Industrial Technology. ., 2012. pp. p-p
@inproceedings{44e54a02b5b148b696d8b82a63027d5c,
title = "Model Based Test Case Generation for Distributed Embedded Systems",
author = "Chimisliu, {Valentin Constantin} and Franz Wotawa",
year = "2012",
language = "English",
pages = "p--p",
booktitle = "International Conference on Industrial Technology",
publisher = ".",

}

TY - GEN

T1 - Model Based Test Case Generation for Distributed Embedded Systems

AU - Chimisliu, Valentin Constantin

AU - Wotawa, Franz

PY - 2012

Y1 - 2012

M3 - Conference contribution

SP - p-p

BT - International Conference on Industrial Technology

PB - .

ER -