Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationTests and Proofs
PublisherSpringer
Pages1-9
Volume8570
DOIs
Publication statusPublished - 2014
EventInternational Conference on Tests and Proofs 2014 - York, United Kingdom
Duration: 24 Jul 201425 Jul 2014

Publication series

NameLecture Notes in Computer Science
PublisherSpringer

Conference

ConferenceInternational Conference on Tests and Proofs 2014
Abbreviated titleTAP 2014
CountryUnited Kingdom
CityYork
Period24/07/1425/07/14

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Projects

Cite this

Aichernig, B., Auer, J., Jöbstl, E., Korosec, R., Krenn, W., Schlick, R., & Schmidt, B. V. (2014). Model-Based Mutation Testing of an Industrial Measurement Device. In Tests and Proofs (Vol. 8570, pp. 1-9). (Lecture Notes in Computer Science). Springer. https://doi.org/10.1007/978-3-319-09099-3_1