Model-Based Mutation Testing of an Industrial Measurement Device

Bernhard Aichernig, Jakob Auer, Elisabeth Jöbstl, Robert Korosec, Willibald Krenn, Rupert Schlick, Birgit Vera Schmidt

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationTests and Proofs
PublisherSpringer
Pages1-9
Volume8570
DOIs
Publication statusPublished - 2014
EventInternational Conference on Tests and Proofs 2014 - York, United Kingdom
Duration: 24 Jul 201425 Jul 2014

Publication series

NameLecture Notes in Computer Science
PublisherSpringer

Conference

ConferenceInternational Conference on Tests and Proofs 2014
Abbreviated titleTAP 2014
CountryUnited Kingdom
CityYork
Period24/07/1425/07/14

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Aichernig, B., Auer, J., Jöbstl, E., Korosec, R., Krenn, W., Schlick, R., & Schmidt, B. V. (2014). Model-Based Mutation Testing of an Industrial Measurement Device. In Tests and Proofs (Vol. 8570, pp. 1-9). (Lecture Notes in Computer Science). Springer. https://doi.org/10.1007/978-3-319-09099-3_1

Model-Based Mutation Testing of an Industrial Measurement Device. / Aichernig, Bernhard; Auer, Jakob; Jöbstl, Elisabeth; Korosec, Robert; Krenn, Willibald; Schlick, Rupert; Schmidt, Birgit Vera.

Tests and Proofs. Vol. 8570 Springer, 2014. p. 1-9 (Lecture Notes in Computer Science).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Aichernig, B, Auer, J, Jöbstl, E, Korosec, R, Krenn, W, Schlick, R & Schmidt, BV 2014, Model-Based Mutation Testing of an Industrial Measurement Device. in Tests and Proofs. vol. 8570, Lecture Notes in Computer Science, Springer, pp. 1-9, International Conference on Tests and Proofs 2014, York, United Kingdom, 24/07/14. https://doi.org/10.1007/978-3-319-09099-3_1
Aichernig B, Auer J, Jöbstl E, Korosec R, Krenn W, Schlick R et al. Model-Based Mutation Testing of an Industrial Measurement Device. In Tests and Proofs. Vol. 8570. Springer. 2014. p. 1-9. (Lecture Notes in Computer Science). https://doi.org/10.1007/978-3-319-09099-3_1
Aichernig, Bernhard ; Auer, Jakob ; Jöbstl, Elisabeth ; Korosec, Robert ; Krenn, Willibald ; Schlick, Rupert ; Schmidt, Birgit Vera. / Model-Based Mutation Testing of an Industrial Measurement Device. Tests and Proofs. Vol. 8570 Springer, 2014. pp. 1-9 (Lecture Notes in Computer Science).
@inproceedings{a48e892bd729413db8d3995d39ace781,
title = "Model-Based Mutation Testing of an Industrial Measurement Device",
author = "Bernhard Aichernig and Jakob Auer and Elisabeth J{\"o}bstl and Robert Korosec and Willibald Krenn and Rupert Schlick and Schmidt, {Birgit Vera}",
year = "2014",
doi = "10.1007/978-3-319-09099-3_1",
language = "English",
volume = "8570",
series = "Lecture Notes in Computer Science",
publisher = "Springer",
pages = "1--9",
booktitle = "Tests and Proofs",

}

TY - GEN

T1 - Model-Based Mutation Testing of an Industrial Measurement Device

AU - Aichernig, Bernhard

AU - Auer, Jakob

AU - Jöbstl, Elisabeth

AU - Korosec, Robert

AU - Krenn, Willibald

AU - Schlick, Rupert

AU - Schmidt, Birgit Vera

PY - 2014

Y1 - 2014

U2 - 10.1007/978-3-319-09099-3_1

DO - 10.1007/978-3-319-09099-3_1

M3 - Conference contribution

VL - 8570

T3 - Lecture Notes in Computer Science

SP - 1

EP - 9

BT - Tests and Proofs

PB - Springer

ER -