Model-based diagnosis and manufacturing control

Franz Wotawa, Martin Ilkerl, Markus Stumptner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Conference on Artificial Intelligence
Publication statusPublished - 2000

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Wotawa, F., Ilkerl, M., & Stumptner, M. (2000). Model-based diagnosis and manufacturing control. In European Conference on Artificial Intelligence (pp. ?-?). ..