Minimizing the Costs of Side-Channel Analysis Resistance Evaluations in Early Design Steps

Thomas Korak, Thomas Plos, Andreas Zankl

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationAvailability, Reliability and Security (ARES), 2013 Eighth International Conference on
PublisherInstitute of Electrical and Electronics Engineers
Publication statusPublished - 2013
Event8th International Conference on Availability, Security, and Reliability: ARES 2013 - Regensburg, Germany
Duration: 2 Sep 20136 Sep 2013


Conference8th International Conference on Availability, Security, and Reliability

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental
  • EU - TAMPRES - TAMper Resistant Sensor node

    Hutter, M., Kirschbaum, M., Plos, T., Korak, T., Wenger, E. & Schmidt, J.


    Project: Research project

  • RFID Security

    Wenger, E., Hutter, M., Oswald, M. E., Posch, K., Plos, T., Herbst, C., Schmidt, J., Feldhofer, M., Szekely, A., Dominikus, S., Aigner, M. J., Kirschbaum, M., Medwed, M. & Posch, R.


    Project: Research area

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