Microstructural characterization of Ti-TiN/CNx gradient-multilayered coatings

Cristina Fernandez-Ramos; J.C. Sanchez-Lopez; A. Justo; T.C. Rojas; Ilse Letofsky-Papst; Ferdinand Hofer; Asuncion Fernandez

Microstructural characterization of Ti-TiN/CNx gradient-multilayered coatings

Cristina Fernandez-Ramos, J.C. Sanchez-Lopez, A. Justo, T.C. Rojas, Ilse Letofsky-Papst, Ferdinand Hofer, Asuncion Fernandez

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	526-532
Journal	Surface and Coatings Technology
Volume	180-181
Publication status	Published - 2004

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Characterization of hard metal-layers and ceramic layers
Warbichler, P., Grogger, W. & Hofer, F.
1/09/96 → 31/12/97
Project: Research project
Analytical Electron Microscopy
Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.
1/01/95 → 31/01/03
Project: Research area

Cite this

@article{dcdf4685e56b4b7681647aebc5fda285,

title = "Microstructural characterization of Ti-TiN/CNx gradient-multilayered coatings",

author = "Cristina Fernandez-Ramos and J.C. Sanchez-Lopez and A. Justo and T.C. Rojas and Ilse Letofsky-Papst and Ferdinand Hofer and Asuncion Fernandez",

year = "2004",

language = "English",

volume = "180-181",

pages = "526--532",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Microstructural characterization of Ti-TiN/CNx gradient-multilayered coatings

AU - Fernandez-Ramos, Cristina

AU - Sanchez-Lopez, J.C.

AU - Justo, A.

AU - Rojas, T.C.

AU - Letofsky-Papst, Ilse

AU - Hofer, Ferdinand

AU - Fernandez, Asuncion

PY - 2004

Y1 - 2004

M3 - Article

SN - 0257-8972

VL - 180-181

SP - 526

EP - 532

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

ER -

Microstructural characterization of Ti-TiN/CNx gradient-multilayered coatings

Treatment code (Nähere Zuordnung)

Projects

Characterization of hard metal-layers and ceramic layers

Analytical Electron Microscopy

Cite this