Microfabrication of the combined AFM-SECM sensors using Focused Ion Beam

Amra Avdic, Alois Lugstein, Ming Wu, Bernhard Gollas

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 28 Jun 2010
Event5th FIB Workshop 2010 - Wien, Austria
Duration: 28 Jun 201029 Jun 2010

Conference

Conference5th FIB Workshop 2010
CountryAustria
CityWien
Period28/06/1029/06/10

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Avdic, A., Lugstein, A., Wu, M., & Gollas, B. (2010). Microfabrication of the combined AFM-SECM sensors using Focused Ion Beam. 5th FIB Workshop 2010, Wien, Austria.