MiAMoRE: a 180nm Analog Integrated Test Chip: Total Ionizing Dose Characterization at Low and Medium Energy X-rays

Research output: Contribution to conferencePosterResearch

Other

Other 2. Fakultätstag ETIT
CountryAustria
CityGraz
Period19/06/18 → …

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Cite this

MiAMoRE: a 180nm Analog Integrated Test Chip : Total Ionizing Dose Characterization at Low and Medium Energy X-rays. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.

2018. Poster session presented at 2. Fakultätstag ETIT, Graz, Austria.

Research output: Contribution to conferencePosterResearch

@conference{e22bc30de35840b0a8997c0f3a4f2323,
title = "MiAMoRE: a 180nm Analog Integrated Test Chip: Total Ionizing Dose Characterization at Low and Medium Energy X-rays",
author = "Varvara Bezhenova and Michalowska-Forsyth, {Alicja Malgorzata}",
year = "2018",
month = "6",
day = "19",
language = "English",
note = "2. Fakult{\"a}tstag ETIT ; Conference date: 19-06-2018",

}

TY - CONF

T1 - MiAMoRE: a 180nm Analog Integrated Test Chip

T2 - Total Ionizing Dose Characterization at Low and Medium Energy X-rays

AU - Bezhenova,Varvara

AU - Michalowska-Forsyth,Alicja Malgorzata

PY - 2018/6/19

Y1 - 2018/6/19

M3 - Poster

ER -