Metrology & methodology of system level ESD testing

D. Lin*, D. Pommerenke, J. Barth, L. G. Henry, H. Hyatt, M. Hopkins, G. Senko, D. Smith

*Corresponding author for this work

Research output: Contribution to journalConference article

Abstract

Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.

Original languageEnglish
Pages (from-to)29-39
Number of pages11
JournalElectrical Overstress Electrostatic Discharge Symposium Proceedings
Publication statusPublished - 1 Dec 1998
Externally publishedYes
EventProceedings of the 1998 20th Annual International EOS/ESD Symposium - Reno, NV, USA
Duration: 6 Oct 19988 Oct 1998

ASJC Scopus subject areas

  • Condensed Matter Physics

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  • Cite this

    Lin, D., Pommerenke, D., Barth, J., Henry, L. G., Hyatt, H., Hopkins, M., ... Smith, D. (1998). Metrology & methodology of system level ESD testing. Electrical Overstress Electrostatic Discharge Symposium Proceedings, 29-39.