Parameters which cause the poor reproducibility of system level ESD tests have been identified: simulator calibration methodology and insufficient simulator specifications. Results of round robin tests we performed at three laboratories are reported. A better calibration methodology for ESD current measurement and additional simulator specifications for output current and radiated fields are proposed.
|Number of pages||11|
|Journal||Electrical Overstress Electrostatic Discharge Symposium Proceedings|
|Publication status||Published - 1 Dec 1998|
|Event||Proceedings of the 1998 20th Annual International EOS/ESD Symposium - Reno, NV, USA|
Duration: 6 Oct 1998 → 8 Oct 1998
ASJC Scopus subject areas
- Condensed Matter Physics