Methodology to Predict EME Effects in CAN Bus Systems Using VHDL-AMS

Mihriban Gürsoy, Stefan Jahn, Bernd Deutschmann

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)993-1002
JournalIEEE Transactions on Electromagnetic Compatibility
Volume50
Issue number4
DOIs
Publication statusPublished - 2008

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  • Sonstiges

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