@inproceedings{3043c37292d641bd8c20b50c26e5a925,
title = "Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon",
author = "Robert Krisper and Fitzek, {Harald Matthias} and Evelin Fisslthaler and Werner Grogger",
year = "2019",
month = apr,
language = "English",
pages = "48",
booktitle = "Workshop Handbook: Program & Abstract",
note = "9th ASEM Workshop for Advanced Electron Microscopy, ASEM Workshop 2019 ; Conference date: 25-04-2019 Through 26-04-2019",
}