Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationWorkshop Handbook: Program & Abstract
Pages48
Publication statusPublished - Apr 2019
EventASEM Workshop 2019 - TU Graz, Graz, Austria
Duration: 25 Apr 201926 Apr 2019

Workshop

WorkshopASEM Workshop 2019
Abbreviated titleASEM
CountryAustria
CityGraz
Period25/04/1926/04/19

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon. / Krisper, Robert; Fitzek, Harald Matthias; Fisslthaler, Evelin; Grogger, Werner.

Workshop Handbook: Program & Abstract. 2019. p. 48.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

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title = "Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Exoeriments via Raman Scattering in Crystalline Silicon",
author = "Robert Krisper and Fitzek, {Harald Matthias} and Evelin Fisslthaler and Werner Grogger",
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month = "4",
language = "English",
pages = "48",
booktitle = "Workshop Handbook: Program & Abstract",

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AU - Krisper, Robert

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AU - Fisslthaler, Evelin

AU - Grogger, Werner

PY - 2019/4

Y1 - 2019/4

M3 - Conference contribution

SP - 48

BT - Workshop Handbook: Program & Abstract

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