Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - Apr 2019
Event9th ASEM Workshop for Advanced Electron Microscopy - TU Graz, Graz, Austria
Duration: 25 Apr 201926 Apr 2019

Workshop

Workshop9th ASEM Workshop for Advanced Electron Microscopy
Abbreviated titleASEM Workshop 2019
CountryAustria
CityGraz
Period25/04/1926/04/19

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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