Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - Apr 2019
EventASEM Workshop 2019 - TU Graz, Graz, Austria
Duration: 25 Apr 201926 Apr 2019

Workshop

WorkshopASEM Workshop 2019
Abbreviated titleASEM
CountryAustria
CityGraz
Period25/04/1926/04/19

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon. / Krisper, Robert; Fitzek, Harald Matthias; Fisslthaler, Evelin; Grogger, Werner.

2019. Poster session presented at ASEM Workshop 2019, Graz, Austria.

Research output: Contribution to conferencePosterResearch

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title = "Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon",
author = "Robert Krisper and Fitzek, {Harald Matthias} and Evelin Fisslthaler and Werner Grogger",
year = "2019",
month = "4",
language = "English",
note = "ASEM Workshop 2019, ASEM ; Conference date: 25-04-2019 Through 26-04-2019",

}

TY - CONF

T1 - Measuring the Temperature Homogeneity Across FIB Lamellae for In Situ TEM Experiments via Raman Scattering in Crystalline Silicon

AU - Krisper, Robert

AU - Fitzek, Harald Matthias

AU - Fisslthaler, Evelin

AU - Grogger, Werner

PY - 2019/4

Y1 - 2019/4

M3 - Poster

ER -