Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)

Bernd Deutschmann; Gunter Winkler; Roland Jungreithmair

Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)

Bernd Deutschmann, Gunter Winkler, Roland Jungreithmair

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Symposium record ; vol. 1
Place of Publication	Piscataway, NY
Publisher	Institute of Electrical and Electronics Engineers
Pages	407-412
ISBN (Print)	0-7803-7264-6
Publication status	Published - 2002
Event	IEEE International Symposium on Electromagnetic Compatibility: EMC 2002 - Minneapolis, United States Duration: 19 Aug 2002 → 23 Aug 2002

Conference

Conference	IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Minneapolis
Period	19/08/02 → 23/08/02

Fields of Expertise

Sonstiges

Electromagnetic Compatibility
Deutschmann, B. & Winkler, G.
1/01/95 → …
Project: Research area

Cite this

Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses). / Deutschmann, Bernd; Winkler, Gunter; Jungreithmair, Roland.
Symposium record ; vol. 1. Piscataway, NY: Institute of Electrical and Electronics Engineers, 2002. p. 407-412.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Deutschmann, B, Winkler, G & Jungreithmair, R 2002, Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses). in Symposium record ; vol. 1. Institute of Electrical and Electronics Engineers, Piscataway, NY, pp. 407-412, IEEE International Symposium on Electromagnetic Compatibility, Minneapolis, Minnesota, United States, 19/08/02.

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title = "Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)",

author = "Bernd Deutschmann and Gunter Winkler and Roland Jungreithmair",

year = "2002",

language = "English",

isbn = "0-7803-7264-6",

pages = "407--412",

booktitle = "Symposium record ; vol. 1",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "IEEE International Symposium on Electromagnetic Compatibility : EMC 2002 ; Conference date: 19-08-2002 Through 23-08-2002",

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T1 - Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)

AU - Deutschmann, Bernd

AU - Winkler, Gunter

AU - Jungreithmair, Roland

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 0-7803-7264-6

SP - 407

EP - 412

BT - Symposium record ; vol. 1

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway, NY

T2 - IEEE International Symposium on Electromagnetic Compatibility

Y2 - 19 August 2002 through 23 August 2002

ER -

Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)

Conference

Fields of Expertise

Projects

Electromagnetic Compatibility

Cite this