Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses)

Bernd Deutschmann, Gunter Winkler, Roland Jungreithmair

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationSymposium record ; vol. 1
Place of PublicationPiscataway, NY
PublisherInstitute of Electrical and Electronics Engineers
Pages407-412
ISBN (Print)0-7803-7264-6
Publication statusPublished - 2002
EventInternational Symposium on Electromagnetic Compatibility - Minneapolis, Minn., United States
Duration: 19 Aug 200223 Aug 2002

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryUnited States
CityMinneapolis, Minn.
Period19/08/0223/08/02

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., Winkler, G., & Jungreithmair, R. (2002). Measuring the Electromagnetic Emissions of Integrated Circuits with IEC 61967-4 ((The Measuring Method and its Weaknesses). In Symposium record ; vol. 1 (pp. 407-412). Piscataway, NY: Institute of Electrical and Electronics Engineers.