Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack

Suyu Yang, Benjamin Orr, Yuangdong Guo, Yilong Zhang, David Pommerenke, Hideki Shumiya, Junji Maeshima, Taketoshi Sekine, Yuzo Takita, Kenji Araki

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

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Computer Science