Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack

Suyu Yang, Benjamin Orr, Yuangdong Guo, Yilong Zhang, David Pommerenke, Hideki Shumiya, Junji Maeshima, Taketoshi Sekine, Yuzo Takita, Kenji Araki

Research output: Chapter in Book/Report/Conference proceedingConference paper

Fingerprint

Dive into the research topics of 'Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science