Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack

Suyu Yang, Benjamin Orr, Yuangdong Guo, Yilong Zhang, David Pommerenke, Hideki Shumiya, Junji Maeshima, Taketoshi Sekine, Yuzo Takita, Kenji Araki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software.

Original languageEnglish
Title of host publication2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
PublisherInstitute of Electrical and Electronics Engineers
Pages41-45
Number of pages5
ISBN (Electronic)9781509014415
DOIs
Publication statusPublished - 19 Sep 2016
Externally publishedYes
Event2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 - Ottawa, Canada
Duration: 25 Jul 201629 Jul 2016

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2016-September
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016
CountryCanada
CityOttawa
Period25/07/1629/07/16

Keywords

  • EMI
  • ESD
  • soft failure
  • testing

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Yang, S., Orr, B., Guo, Y., Zhang, Y., Pommerenke, D., Shumiya, H., ... Araki, K. (2016). Measurement techniques to predict the soft failure susceptibility of an IC without the aid of a complete software stack. In 2016 IEEE International Symposium on Electromagnetic Compatibility, EMC 2016 (pp. 41-45). [7571597] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2016-September). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2016.7571597