Physical modelling helps to understand the materials response during the processing as well as in service conditions. The very basic requirements for the development and validations of deformation related physics based models are different dislocation densities. Transmission electron microscopy (TEM), electron backscatter diffraction (EBSD) and X-ray diffraction (XRD) are used to characterize the dislocation densities in a 12% Cr steel. The distinction between internal and boundary dislocations is achieved by applying these techniques together. A hybrid approach is used to model the creep behaviour and experimental results were compared with theoretical predictions.
|Publication status||Published - Jul 2017|
|Event||International Conference on Electron Microscopy & Allied Techniques - IGCAR, Kalpakkam, India|
Duration: 17 Jul 2017 → 19 Jul 2017
|Conference||International Conference on Electron Microscopy & Allied Techniques|
|Abbreviated title||EMSI 2017|
|Period||17/07/17 → 19/07/17|