Measurement methodology for establishing an IC ESD sensitivity database

Zhen Li; Jiang Xiao; Byongsu Seol; Jongsung Lee; David Pommerenke

doi:10.1109/APEMC.2010.5475629

Measurement methodology for establishing an IC ESD sensitivity database

Zhen Li^*, Jiang Xiao, Byongsu Seol, Jongsung Lee, David Pommerenke

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.

Original language	English
Title of host publication	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages	1051-1054
Number of pages	4
DOIs	https://doi.org/10.1109/APEMC.2010.5475629
Publication status	Published - 2 Aug 2010
Externally published	Yes
Event	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China Duration: 12 Apr 2010 → 16 Apr 2010

Publication series

Name	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference	2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Country/Territory	China
City	Beijing
Period	12/04/10 → 16/04/10

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/APEMC.2010.5475629

Cite this

Measurement methodology for establishing an IC ESD sensitivity database. / Li, Zhen; Xiao, Jiang; Seol, Byongsu et al.
2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. 2010. p. 1051-1054 5475629 (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Li, Z, Xiao, J, Seol, B, Lee, J & Pommerenke, D 2010, Measurement methodology for establishing an IC ESD sensitivity database. in 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010., 5475629, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010, pp. 1051-1054, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010, Beijing, China, 12/04/10. https://doi.org/10.1109/APEMC.2010.5475629

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AB - Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.

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Measurement methodology for establishing an IC ESD sensitivity database

Abstract

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Conference

ASJC Scopus subject areas

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