TY - GEN
T1 - Measurement methodology for establishing an IC ESD sensitivity database
AU - Li, Zhen
AU - Xiao, Jiang
AU - Seol, Byongsu
AU - Lee, Jongsung
AU - Pommerenke, David
PY - 2010/8/2
Y1 - 2010/8/2
N2 - Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.
AB - Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.
UR - http://www.scopus.com/inward/record.url?scp=77954989411&partnerID=8YFLogxK
U2 - 10.1109/APEMC.2010.5475629
DO - 10.1109/APEMC.2010.5475629
M3 - Conference paper
AN - SCOPUS:77954989411
SN - 9781424456215
T3 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
SP - 1051
EP - 1054
BT - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
T2 - 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Y2 - 12 April 2010 through 16 April 2010
ER -