Measurement methodology for establishing an IC ESD sensitivity database

Zhen Li*, Jiang Xiao, Byongsu Seol, Jongsung Lee, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.

Original languageEnglish
Title of host publication2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
Pages1051-1054
Number of pages4
DOIs
Publication statusPublished - 2 Aug 2010
Externally publishedYes
Event2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
Duration: 12 Apr 201016 Apr 2010

Publication series

Name2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

Conference

Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
CountryChina
CityBeijing
Period12/04/1016/04/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Li, Z., Xiao, J., Seol, B., Lee, J., & Pommerenke, D. (2010). Measurement methodology for establishing an IC ESD sensitivity database. In 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 (pp. 1051-1054). [5475629] (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010). https://doi.org/10.1109/APEMC.2010.5475629