Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation

David Seebacher, Michael Gebhart, Michael Stark

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProc. of IEEE RFID-Technologies and Applications
PublisherIEEE Publications
Pages0-0
Publication statusPublished - 2011
Event2011 IEEE RFID-Technologies and Applications - Sitges, Spain
Duration: 15 Sep 201116 Sep 2011

Conference

Conference2011 IEEE RFID-Technologies and Applications
CountrySpain
CitySitges
Period15/09/1116/09/11

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application

Cite this

Seebacher, D., Gebhart, M., & Stark, M. (2011). Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation. In Proc. of IEEE RFID-Technologies and Applications (pp. 0-0). IEEE Publications.

Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation. / Seebacher, David; Gebhart, Michael; Stark, Michael.

Proc. of IEEE RFID-Technologies and Applications. IEEE Publications, 2011. p. 0-0.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Seebacher, D, Gebhart, M & Stark, M 2011, Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation. in Proc. of IEEE RFID-Technologies and Applications. IEEE Publications, pp. 0-0, 2011 IEEE RFID-Technologies and Applications, Sitges, Spain, 15/09/11.
Seebacher D, Gebhart M, Stark M. Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation. In Proc. of IEEE RFID-Technologies and Applications. IEEE Publications. 2011. p. 0-0
Seebacher, David ; Gebhart, Michael ; Stark, Michael. / Measurement Instrument Selection for Very High Bit Rate Contactless Transponder Evaluation. Proc. of IEEE RFID-Technologies and Applications. IEEE Publications, 2011. pp. 0-0
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