Abstract
This paper elaborates in detail which matching dynamics occur when mirroring bidirectional currents. Formulas for the matching error of bidirectional current mirrors are deduced from the unidirectional case. Simulation results confirm these calculations and verify that the matching degradation due to the bidirectional nature is stronger than the degradation due to the transistor coming into weak inversion. Depending on whether or not calibration is acceptable the paper states suitable design considerations.
Original language | English |
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Title of host publication | Proceedings - 2019 Austrochip Workshop on Microelectronics, Austrochip 2019 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 65-70 |
Number of pages | 6 |
ISBN (Electronic) | 9781728119533 |
DOIs | |
Publication status | Published - 1 Oct 2019 |
Event | 27th Austrochip Workshop on Microelectronics: Austrochip 2019 - FH Technikum Wien, Wien, Austria Duration: 24 Oct 2019 → 24 Oct 2019 Conference number: 27 https://embsys.technikum-wien.at/austrochip2019/ https://embsys.technikum-wien.at/austrochip2019/program/index.htm |
Publication series
Name | Proceedings - 2019 Austrochip Workshop on Microelectronics, Austrochip 2019 |
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Workshop
Workshop | 27th Austrochip Workshop on Microelectronics |
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Abbreviated title | Austrochip |
Country/Territory | Austria |
City | Wien |
Period | 24/10/19 → 24/10/19 |
Internet address |
Keywords
- CCII
- Current conveyor
- Current mirror
- Matching
- Output-stage
- Quiescent current
- Transimpedance amplifier
- Weak inversion
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Instrumentation
- Computer Networks and Communications