Markov Random Fields for Pattern Extraction in Analog Wafer Test Data

Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kaestner, Roman Kern

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageGerman
Title of host publicationInternational Conference on Image Processing Theory, Tools and Applications (IPTA 2017)
Publication statusPublished - 2017

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