Mapping surface plasmons in the nanometer regime

Franz Schmidt, Harald Ditlbacher, Andreas Hohenau, Ulrich Hohenester, Ferdinand Hofer, Joachim R. Krenn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationFinal program and abstracts
Publisher.
Pagesxx-xx
Publication statusPublished - 2013
EventEnhanced Data Generated by Electrons - Sainte Maxime, France
Duration: 26 May 201331 May 2013

Conference

ConferenceEnhanced Data Generated by Electrons
CountryFrance
CitySainte Maxime
Period26/05/1331/05/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmidt, F., Ditlbacher, H., Hohenau, A., Hohenester, U., Hofer, F., & Krenn, J. R. (2013). Mapping surface plasmons in the nanometer regime. In Final program and abstracts (pp. xx-xx). ..