Mapping surface plasmons in the nanometer regime

Franz Schmidt, Harald Ditlbacher, Andreas Hohenau, Ulrich Hohenester, Ferdinand Hofer, Joachim R. Krenn

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationFinal program and abstracts
Publisher.
Pagesxx-xx
Publication statusPublished - 2013
EventEnhanced Data Generated by Electrons - Sainte Maxime, France
Duration: 26 May 201331 May 2013

Conference

ConferenceEnhanced Data Generated by Electrons
Country/TerritoryFrance
CitySainte Maxime
Period26/05/1331/05/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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