Abstract
The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.
Original language | English |
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Title of host publication | Digests of the Intermag Conference |
Pages | EB03 |
Publication status | Published - 1 Dec 2002 |
Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002 |
Conference
Conference | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG |
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Country/Territory | Netherlands |
City | Amsterdam |
Period | 28/04/02 → 2/05/02 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering