Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes

Kannan M. Krishnan, W. Grogger, G. Kusinski, M. E. Gomez, I. Schuller, E.C. Nelson

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The magnetic properties of the materials were studied at relevant length scales. The domain structures in patterned magnetic elements were observed by using Lorentz imaging. It was shown that the advances in the development of the magentic materials depended on the ability to characterize them by a range of electron-optic and X-ray scattering/dichroism techniques.

Original languageEnglish
Title of host publicationDigests of the Intermag Conference
PagesEB03
Publication statusPublished - 1 Dec 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 28 Apr 20022 May 2002

Conference

Conference2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG
CountryNetherlands
CityAmsterdam
Period28/04/022/05/02

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Krishnan, K. M., Grogger, W., Kusinski, G., Gomez, M. E., Schuller, I., & Nelson, E. C. (2002). Magnetism and microstructure at relevant length scales: Complementary measurements with electron and photon probes. In Digests of the Intermag Conference (pp. EB03)