Low Voltage EDXS and First Row transition Elements

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationModern Developments and Applications in Microbeam Analysis
Publisher.
Pages329-329
Publication statusPublished - 1999
EventEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Konstanz, Germany
Duration: 3 May 19997 May 1999

Conference

ConferenceEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
CountryGermany
CityKonstanz
Period3/05/997/05/99

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Pölt, P. (1999). Low Voltage EDXS and First Row transition Elements. In Modern Developments and Applications in Microbeam Analysis (pp. 329-329). ..

Low Voltage EDXS and First Row transition Elements. / Pölt, Peter.

Modern Developments and Applications in Microbeam Analysis. ., 1999. p. 329-329.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Pölt, P 1999, Low Voltage EDXS and First Row transition Elements. in Modern Developments and Applications in Microbeam Analysis. ., pp. 329-329, European Workshop on Modern Developments and Applications in Microbeam Analysis, Konstanz, Germany, 3/05/99.
Pölt P. Low Voltage EDXS and First Row transition Elements. In Modern Developments and Applications in Microbeam Analysis. . 1999. p. 329-329
Pölt, Peter. / Low Voltage EDXS and First Row transition Elements. Modern Developments and Applications in Microbeam Analysis. ., 1999. pp. 329-329
@inproceedings{1b61af04012b416b9c99c0f60db65468,
title = "Low Voltage EDXS and First Row transition Elements",
author = "Peter P{\"o}lt",
year = "1999",
language = "English",
pages = "329--329",
booktitle = "Modern Developments and Applications in Microbeam Analysis",
publisher = ".",

}

TY - GEN

T1 - Low Voltage EDXS and First Row transition Elements

AU - Pölt, Peter

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 329

EP - 329

BT - Modern Developments and Applications in Microbeam Analysis

PB - .

ER -