Low-loss EELS Measurements with Monochromated Electrons

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 2 Sep 2007
EventMicroscopy Conference 2005 - 6.Dreiländertagung 2005: MC05 - Davos, Switzerland
Duration: 28 Aug 20052 Sep 2005

Conference

ConferenceMicroscopy Conference 2005 - 6.Dreiländertagung 2005
CountrySwitzerland
CityDavos
Period28/08/052/09/05

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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