Low-loss EELS measurements on an oxide multilayer system using monochrome

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 1 Sep 2008
EventEMC 2008: European Microscopy Conference 2008 - Aachen, Germany
Duration: 1 Sep 20085 Sep 2008

Conference

ConferenceEMC 2008
CountryGermany
CityAachen
Period1/09/085/09/08

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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