Low-loss EELS measurements on an oxide multilayer system using monochrome electrons

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Microscopy Congress
Place of PublicationBerlin
PublisherSpringer
Pages399-400
VolumeVolume1
ISBN (Print)978-3-540-85154-7
Publication statusPublished - 2008
EventEuropean Microscopy Congress - Aachen, Germany
Duration: 1 Sep 20085 Sep 2008

Publication series

NameInstrumentation and Methods
PublisherSpringer

Conference

ConferenceEuropean Microscopy Congress
CountryGermany
CityAachen
Period1/09/085/09/08

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Kothleitner, G., Schaffer, B., & Dienstleder, M. (2008). Low-loss EELS measurements on an oxide multilayer system using monochrome electrons. In European Microscopy Congress (Vol. Volume1, pp. 399-400). (Instrumentation and Methods). Berlin: Springer.