Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials

Robert Schennach, M Y A Mollah, J R Parga, David L Cocke

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 8 Nov 2000
Event22nd International Congress on Metallurgy and Materials - Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico
Duration: 8 Nov 200010 Nov 2000

Conference

Conference22nd International Congress on Metallurgy and Materials
CountryMexico
CityInstituto Tecnológico de Saltillo, Saltillo, Coahuila
Period8/11/0010/11/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schennach, R., Mollah, M. Y. A., Parga, J. R., & Cocke, D. L. (2000). Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. 22nd International Congress on Metallurgy and Materials, Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico.

Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. / Schennach, Robert; Mollah, M Y A; Parga, J R; Cocke, David L.

2000. 22nd International Congress on Metallurgy and Materials, Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Schennach, R, Mollah, MYA, Parga, JR & Cocke, DL 2000, 'Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials' 22nd International Congress on Metallurgy and Materials, Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico, 8/11/00 - 10/11/00, .
Schennach R, Mollah MYA, Parga JR, Cocke DL. Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. 2000. 22nd International Congress on Metallurgy and Materials, Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico.
Schennach, Robert ; Mollah, M Y A ; Parga, J R ; Cocke, David L. / Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. 22nd International Congress on Metallurgy and Materials, Instituto Tecnológico de Saltillo, Saltillo, Coahuila, Mexico.
@conference{eb9043a8d766498d9b073df57ff72fdd,
title = "Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials",
author = "Robert Schennach and Mollah, {M Y A} and Parga, {J R} and Cocke, {David L}",
year = "2000",
month = "11",
day = "8",
language = "English",
note = "22nd International Congress on Metallurgy and Materials ; Conference date: 08-11-2000 Through 10-11-2000",

}

TY - CONF

T1 - Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials

AU - Schennach, Robert

AU - Mollah, M Y A

AU - Parga, J R

AU - Cocke, David L

PY - 2000/11/8

Y1 - 2000/11/8

M3 - (Old data) Lecture or Presentation

ER -