Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials

Robert Schennach, M Y A Mollah, J R Parga, David L Cocke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 22nd International Congress on Metallurgy and Materials
Place of PublicationSaltillo, Mexico
PublisherInst. Tecnologico de Saltillo
Pages122-122
Publication statusPublished - 2000
EventInternational Congress on Metallurgy and Materials - Saltillo, Mexico
Duration: 8 Nov 200010 Nov 2000

Conference

ConferenceInternational Congress on Metallurgy and Materials
CountryMexico
CitySaltillo
Period8/11/0010/11/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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