Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials

Robert Schennach, M Y A Mollah, J R Parga, David L Cocke

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 22nd International Congress on Metallurgy and Materials
Place of PublicationSaltillo, Mexico
PublisherInst. Tecnologico de Saltillo
Pages122-122
Publication statusPublished - 2000
EventInternational Congress on Metallurgy and Materials - Saltillo, Mexico
Duration: 8 Nov 200010 Nov 2000

Conference

ConferenceInternational Congress on Metallurgy and Materials
CountryMexico
CitySaltillo
Period8/11/0010/11/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schennach, R., Mollah, M. Y. A., Parga, J. R., & Cocke, D. L. (2000). Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. In Proceedings of the 22nd International Congress on Metallurgy and Materials (pp. 122-122). Saltillo, Mexico: Inst. Tecnologico de Saltillo.

Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. / Schennach, Robert; Mollah, M Y A; Parga, J R; Cocke, David L.

Proceedings of the 22nd International Congress on Metallurgy and Materials. Saltillo, Mexico : Inst. Tecnologico de Saltillo, 2000. p. 122-122.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Schennach, R, Mollah, MYA, Parga, JR & Cocke, DL 2000, Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. in Proceedings of the 22nd International Congress on Metallurgy and Materials. Inst. Tecnologico de Saltillo, Saltillo, Mexico, pp. 122-122, International Congress on Metallurgy and Materials, Saltillo, Mexico, 8/11/00.
Schennach R, Mollah MYA, Parga JR, Cocke DL. Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. In Proceedings of the 22nd International Congress on Metallurgy and Materials. Saltillo, Mexico: Inst. Tecnologico de Saltillo. 2000. p. 122-122
Schennach, Robert ; Mollah, M Y A ; Parga, J R ; Cocke, David L. / Linear sweep voltammetric and galvanostatic reduction for interfacial characterization of materials. Proceedings of the 22nd International Congress on Metallurgy and Materials. Saltillo, Mexico : Inst. Tecnologico de Saltillo, 2000. pp. 122-122
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booktitle = "Proceedings of the 22nd International Congress on Metallurgy and Materials",
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AU - Schennach, Robert

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AU - Cocke, David L

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Y1 - 2000

M3 - Conference contribution

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BT - Proceedings of the 22nd International Congress on Metallurgy and Materials

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