Original language | English |
---|---|
Title of host publication | NASA Formal Methods - 9th International Symposium |
Publisher | Springer International Publishing AG |
Pages | 19-34 |
Number of pages | 16 |
DOIs | |
Publication status | Published - 2017 |
Event | NASA Formal Methods Symposium - Moffett Field, Ca., United States Duration: 16 May 2017 → 18 May 2017 |
Publication series
Name | Lecture Notes in Computer Science |
---|---|
Publisher | Springer International Publishing AG |
Volume | 10227 |
ISSN (Print) | 0302-9743 |
ISSN (Electronic) | 1611-3349 |
Conference
Conference | NASA Formal Methods Symposium |
---|---|
Abbreviated title | NFM 2017 |
Country | United States |
City | Moffett Field, Ca. |
Period | 16/05/17 → 18/05/17 |
Fields of Expertise
- Information, Communication & Computing
Cite this
Learning from Faults: Mutation Testing in Active Automata Learning. / Aichernig, Bernhard K.; Tappler, Martin.
NASA Formal Methods - 9th International Symposium. Springer International Publishing AG , 2017. p. 19-34 (Lecture Notes in Computer Science; Vol. 10227).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Learning from Faults: Mutation Testing in Active Automata Learning
AU - Aichernig, Bernhard K.
AU - Tappler, Martin
PY - 2017
Y1 - 2017
U2 - 10.1007/978-3-319-57288-8_2
DO - 10.1007/978-3-319-57288-8_2
M3 - Conference contribution
T3 - Lecture Notes in Computer Science
SP - 19
EP - 34
BT - NASA Formal Methods - 9th International Symposium
PB - Springer International Publishing AG
ER -