Learning from Faults: Mutation Testing in Active Automata Learning

Bernhard K. Aichernig; Martin Tappler

doi:10.1007/978-3-319-57288-8_2

Learning from Faults: Mutation Testing in Active Automata Learning

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Original language	English
Title of host publication	NASA Formal Methods - 9th International Symposium
Publisher	Springer International Publishing AG
Pages	19-34
Number of pages	16
DOIs	https://doi.org/10.1007/978-3-319-57288-8_2
Publication status	Published - 2017
Event	NASA Formal Methods Symposium - Moffett Field, Ca., United States Duration: 16 May 2017 → 18 May 2017

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer International Publishing AG
Volume	10227
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	NASA Formal Methods Symposium
Abbreviated title	NFM 2017
Country	United States
City	Moffett Field, Ca.
Period	16/05/17 → 18/05/17

Fields of Expertise

Information, Communication & Computing

Access to Document

10.1007/978-3-319-57288-8_2

http://dx.doi.org/10.1007/978-3-319-57288-8_2

1 Active

Dependable Internet of Things
Boano, C. A., Kubin, G., Bloem, R., Horn, M., Pernkopf, F., Zakany, N., Mangard, S., Witrisal, K., Römer, K. U., Aichernig, B., Bösch, W., Baunach, M. C., Tappler, M., Malenko, M., Weiser, S., Eichlseder, M., Leitinger, E., Grosinger, J., Großwindhager, B., Ebrahimi, M., Alothman Alterkawi, A. B., Knoll, C., Teschl, R., Saukh, O., Rath, M., Steinberger, M., Steinbauer-Wagner, G. & Tranninger, M.
1/01/16 → 31/03/22
Project: Research project

Cite this

Aichernig, BK & Tappler, M 2017, Learning from Faults: Mutation Testing in Active Automata Learning. in NASA Formal Methods - 9th International Symposium. Lecture Notes in Computer Science, vol. 10227, Springer International Publishing AG , pp. 19-34, NASA Formal Methods Symposium, Moffett Field, Ca., United States, 16/05/17. https://doi.org/10.1007/978-3-319-57288-8_2

@inproceedings{732908035efe464b9d6428fe7503fca6,

title = "Learning from Faults: Mutation Testing in Active Automata Learning",

author = "Aichernig, {Bernhard K.} and Martin Tappler",

year = "2017",

doi = "10.1007/978-3-319-57288-8_2",

language = "English",

series = "Lecture Notes in Computer Science",

publisher = "Springer International Publishing AG ",

pages = "19--34",

booktitle = "NASA Formal Methods - 9th International Symposium",

address = "Switzerland",

note = "NASA Formal Methods Symposium, NFM 2017 ; Conference date: 16-05-2017 Through 18-05-2017",

}

TY - GEN

T1 - Learning from Faults: Mutation Testing in Active Automata Learning

AU - Aichernig, Bernhard K.

AU - Tappler, Martin

PY - 2017

Y1 - 2017

U2 - 10.1007/978-3-319-57288-8_2

DO - 10.1007/978-3-319-57288-8_2

M3 - Conference paper

T3 - Lecture Notes in Computer Science

SP - 19

EP - 34

BT - NASA Formal Methods - 9th International Symposium

PB - Springer International Publishing AG

T2 - NASA Formal Methods Symposium

Y2 - 16 May 2017 through 18 May 2017

ER -

Learning from Faults: Mutation Testing in Active Automata Learning

Publication series

Conference

Fields of Expertise

Access to Document

Projects

Dependable Internet of Things

Cite this