Laser optical in-circuit measurement system for immunity applications

Ding Chong*, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.

Original languageEnglish
Title of host publication2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
Pages569-574
Number of pages6
Publication statusPublished - 1 Dec 2006
Externally publishedYes
Event2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, OR, United States
Duration: 14 Aug 200618 Aug 2006

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume3
ISSN (Print)1077-4076

Conference

Conference2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
CountryUnited States
CityPortland, OR
Period14/08/0618/08/06

Keywords

  • EM coupling
  • Non-ideal shielding
  • Optical link
  • Susceptibility test

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Chong, D., & Pommerenke, D. (2006). Laser optical in-circuit measurement system for immunity applications. In 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 (pp. 569-574). [1706373] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 3).