Knife Edge Diffraction for Spatially Extended Light Sources

Christian Mentin, Robin Priewald, Eugen Brenner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

The position of an object’s edge can be
determined from its shadow projected onto a CCD or
CMOS sensor without any additional optical elements
such as lenses. Nevertheless, in many applications a
collimated Laser light beam is used to illuminate the
measured object. Since laser diodes are often
complicated in handling, and mostly need additional
expensive Laser driver hardware, new approaches
were considered. Spatially extended light sources such
as off-the-shelf LEDs could be used for edge detection
in combination with diffraction pattern analysis,
without the need of any additional collimation optics
for illumination. Results and applicability for simple
position measurement are discussed.
LanguageEnglish
Title of host publicationProceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
Pages134-139
Number of pages6
StatusPublished - 7 Sep 2016
Event21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT - Budapest, Hungary
Duration: 7 Sep 20169 Sep 2016

Conference

Conference21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT
CountryHungary
CityBudapest
Period7/09/169/09/16

Fingerprint

light sources
edge detection
collimation
shelves
diffraction
light beams
charge coupled devices
CMOS
hardware
light emitting diodes
diffraction patterns
semiconductor lasers
illumination
lenses
laser beams
optics
sensors
lasers

Keywords

  • CCD Sensor
  • Knife Edge Diffraction

Cite this

Mentin, C., Priewald, R., & Brenner, E. (2016). Knife Edge Diffraction for Spatially Extended Light Sources. In Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING (pp. 134-139)

Knife Edge Diffraction for Spatially Extended Light Sources. / Mentin, Christian; Priewald, Robin; Brenner, Eugen.

Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING . 2016. p. 134-139.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Mentin, C, Priewald, R & Brenner, E 2016, Knife Edge Diffraction for Spatially Extended Light Sources. in Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING . pp. 134-139, 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, Budapest, Hungary, 7/09/16.
Mentin C, Priewald R, Brenner E. Knife Edge Diffraction for Spatially Extended Light Sources. In Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING . 2016. p. 134-139.
Mentin, Christian ; Priewald, Robin ; Brenner, Eugen. / Knife Edge Diffraction for Spatially Extended Light Sources. Proceedings of the 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT, and 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING . 2016. pp. 134-139
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abstract = "The position of an object’s edge can bedetermined from its shadow projected onto a CCD orCMOS sensor without any additional optical elementssuch as lenses. Nevertheless, in many applications acollimated Laser light beam is used to illuminate themeasured object. Since laser diodes are oftencomplicated in handling, and mostly need additionalexpensive Laser driver hardware, new approacheswere considered. Spatially extended light sources suchas off-the-shelf LEDs could be used for edge detectionin combination with diffraction pattern analysis,without the need of any additional collimation opticsfor illumination. Results and applicability for simpleposition measurement are discussed.",
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