Jitter: Basics, relevance and measurement methods

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	2008 IEEE International Symposium on Electromagnetic Compatibility
Volume	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652242
Publication status	Published - 1 Jan 2008
Externally published	Yes
Event	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, United States Duration: 18 Aug 2008 → 22 Aug 2008

Conference	2008 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Detroit
Period	18/08/08 → 22/08/08

ASJC Scopus subject areas

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title = "Jitter: Basics, relevance and measurement methods",

author = "David Pommerenke",

year = "2008",

month = jan,

day = "1",

doi = "10.1109/ISEMC.2008.4652242",

language = "English",

volume = "2008-January",

booktitle = "2008 IEEE International Symposium on Electromagnetic Compatibility",

note = "2008 IEEE International Symposium on Electromagnetic Compatibility : EMC 2008 ; Conference date: 18-08-2008 Through 22-08-2008",

}

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T1 - Jitter

T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility

AU - Pommerenke, David

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U2 - 10.1109/ISEMC.2008.4652242

DO - 10.1109/ISEMC.2008.4652242

M3 - Conference paper

AN - SCOPUS:84932171759

VL - 2008-January

BT - 2008 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 18 August 2008 through 22 August 2008

ER -