Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

Research output: Contribution to conferenceAbstractResearch

Original languageEnglish
Pages21
Number of pages1
Publication statusPublished - Apr 2018
EventRADHARD Symposium 2018 - Seibersdorf Laboratories, Seibersdorf, Austria
Duration: 24 Apr 201825 Apr 2018
https://www.seibersdorf-laboratories.at/en/radhard/archive/2018-radhard-symposium

Workshop

WorkshopRADHARD Symposium 2018
CountryAustria
CitySeibersdorf
Period24/04/1825/04/18
Internet address

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical
  • Experimental

Cite this

Bezhenova, V., & Michalowska-Forsyth, A. M. (2018). Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing. 21. Abstract from RADHARD Symposium 2018, Seibersdorf, Austria.