Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

Research output: Contribution to conferenceAbstractResearch

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical
  • Experimental

Cite this

Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.

2018. 21 Abstract from RADHARD Symposium 2018, Seibersdorf, Austria.

Research output: Contribution to conferenceAbstractResearch

@conference{f44022ccbe5945d4b31468dc48a11c4a,
title = "Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing",
author = "Varvara Bezhenova and Michalowska-Forsyth, {Alicja Malgorzata}",
year = "2018",
month = "4",
language = "English",
pages = "21",
note = "RADHARD Symposium 2018 ; Conference date: 24-04-2018 Through 25-04-2018",
url = "https://www.seibersdorf-laboratories.at/en/radhard/archive/2018-radhard-symposium",

}

TY - CONF

T1 - Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

AU - Bezhenova,Varvara

AU - Michalowska-Forsyth,Alicja Malgorzata

PY - 2018/4

Y1 - 2018/4

M3 - Abstract

SP - 21

ER -