Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

Research output: Contribution to conferenceAbstract

Original languageEnglish
Pages21
Number of pages1
Publication statusPublished - Apr 2018
EventRADHARD Symposium 2018 - Seibersdorf Laboratories, Seibersdorf, Austria
Duration: 24 Apr 201825 Apr 2018
https://www.seibersdorf-laboratories.at/en/radhard/archive/2018-radhard-symposium

Workshop

WorkshopRADHARD Symposium 2018
CountryAustria
CitySeibersdorf
Period24/04/1825/04/18
Internet address

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical
  • Experimental

Projects

Activities

  • 1 Conference or symposium (Participation in/Organisation of)
  • 1 Invited talk at conference or symposium

RADHARD Symposium 2018

Varvara Bezhenova (Participant), Alicja Malgorzata Michalowska-Forsyth (Participant)
24 Apr 201825 Apr 2018

Activity: Participation in or organisation ofConference or symposium (Participation in/Organisation of)

Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

Varvara Bezhenova (Speaker), Alicja Malgorzata Michalowska-Forsyth (Contributor)
25 Apr 2018

Activity: Talk or presentationInvited talk at conference or symposiumScience to science

Cite this

Bezhenova, V., & Michalowska-Forsyth, A. M. (2018). Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing. 21. Abstract from RADHARD Symposium 2018, Seibersdorf, Austria.