Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?

M. Sezen; P.M. Nellen; S. Meier; B. Chernev; E. Fisslthaler; Peter Pölt; E. Tchernychova; W. Grogger; H. Plank; Emil List

doi:10.1017/S143192760707571X

Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?

M. Sezen, P.M. Nellen, S. Meier, B. Chernev, E. Fisslthaler, Peter Pölt, E. Tchernychova, W. Grogger, H. Plank, Emil List

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1502-1503
Journal	Microscopy and Microanalysis
Volume	13
Issue number	S02
DOIs	https://doi.org/10.1017/S143192760707571X
Publication status	Published - 2007

Fields of Expertise

Advanced Materials Science

Access to Document

10.1017/S143192760707571X

Cite this

@article{7fd6d82752ed4eb0973c981cd01820cb,

title = "Ion Beam Irradiation Damage on poly(3-hexylthiophene) (P3HT) Based Organic Optoelectronic Devices: Can Cryo-FIB Help?",

author = "M. Sezen and P.M. Nellen and S. Meier and B. Chernev and E. Fisslthaler and Peter P{\"o}lt and E. Tchernychova and W. Grogger and H. Plank and Emil List",

year = "2007",

doi = "10.1017/S143192760707571X",

language = "English",

volume = "13",

pages = "1502--1503",

journal = "Microscopy and Microanalysis",

issn = "1435-8115",