Investigation of the near fields of sputtered Au thinfilms used for SERS, using the AFM and DDA

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2016
EventThe 16th European Microscopy Congress - Lyon Convention Center, Lyon, France
Duration: 28 Aug 20162 Sep 2016
Conference number: 16
http://www.emc2016.fr/en/

Conference

ConferenceThe 16th European Microscopy Congress
Abbreviated titleEMC 2016
CountryFrance
CityLyon
Period28/08/162/09/16
Internet address

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Fitzek, H. M., Sattelkow, J., & Pölt, P. (2016). Investigation of the near fields of sputtered Au thinfilms used for SERS, using the AFM and DDA. Poster session presented at The 16th European Microscopy Congress, Lyon, France.